产品方案
产品方案
Optical Thin Film measurement equipment High Yield® series

High Yield® series uses Mueller matrix and reflection-based spectral fusion technology, provide optical metrology solution for deposition processes control including CVD, PVD, ALD, etc.. High Yield® series monitor film thickness, optical constants (refractive index n, extinction coefficient k, etc.), bandgap width, defects of film, ultra-thin film and multilayer stack.

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Shenzhen Angstrom Excellence Technology Co. Ltd All Rights Reserved
ICP:2023084378   44030902004036