产品方案
产品方案
X-ray Contaminations Metrology Åthena Fullfillment™ Series
Total Reflection X-ray Fluorescence (TXRF) measurement technology; Quickly and accurately detect various types of dirt and metal contamination on the wafer surface.
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Shenzhen Angstrom Excellence Technology Co. Ltd All Rights Reserved
ICP:2023084378   44030902004036