Angstrom Science AS-100
AS-100 is a commercial film thickness measuring instrument. Its compact structure allows convenient use and high cost effective. AS-100 contains a rotatable analyzer suitable for measuring various film thickness of single layer materials
Using LDLS, the spectrum covers the ultraviolet to near infrared band (350~850nm)
Contains a rotatable analyzer detecting 9 elements of the Mueller matrix for reliable sample information
Measuring spot size <1mm, suitable for various sample sizes
Observation of new materials and physical phenomena in scientific research, nonlinear effects, anisotropy of dispersion, etc.
Film layer measurement of solar photovoltaic panels
Optical component coating inspection
Biological and chemical organic film measurement, protein molecular detection
Refractive index measurement of solid materials
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ICP:2023084378   44030902004036