About AE
About AE|Development History|Vision/Mission/Value|
Development History
  • October 2020: Shenzhen Angstrom Excellence Technology Company  was established.
  • March 2021: Completed the verification of optical ellipsometry thin-film measurement technology.
  • May 2021: Completed the verification of optical reflective thin-film measurement technology.
  • July 2021: Completed the verification of TXRF (Total Reflection X-ray Fluorescence) and GIXRF (Grazing Incidence X-ray Fluorescence) technologies.
  • December 2021:
    • Completed the prototype of the HY-100 optical film thickness measurement device.
    • Built a cleanroom exceeding 1,000 square meters, meeting Class 10, Class 100, and Class 1,000 standards.
  • February 2022: Completed the prototype of the AX-T100 X-ray thin-film measurement device.
  • January 2023: Optical and X-ray measurement equipment became commercially available.
  • March 2024: Activated a 5,300-square-meter mass production space, expanding the total area of R&D and production facilities in Shenzhen to 7,300 square meters.
  • Starting 2024: Optical and X-ray measurement equipment entered large-scale mass production.
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